In transmission electron microscopy (TEM) analysis, the primary and crucial step in obtaining a high-quality image that can be interpreted reasonably is sample preparation. Inappropriate sample thickness, poor conductivity, or damage introduced during sample preparation can directly lead to abnormal electron beam penetration, image distortion, and even sample scrapping. TEM sample requirements ① T...
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1.Characterization of particle size and distribution Dynamic Light Scattering (DLS): DLS is one of the most commonly used techniques for measuring the particle size and distribution of nanoparticles in suspensions. It calculates the hydrodynamic diameter of particles by measuring the time-dependent light scattering intensity fluctuations caused by Brownian motion of particles. DLS can also provide...
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