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  • 17

    May

    Noun explanation: XRF, EDS and ICP in component analysis

    1, XRF (X Ray Fluorescence X-ray fluorescence) Use this method for surface chemical analysis, but you must purchase standard samples and draw standard curves. The measured sample must meet a number of conditions, such as a smooth surface and uniform composition. If the composition is not uniform, it can only be stated that the composition of the micro-area measured by XRF is the same, and the othe...
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  • 09

    Jun

    Characterization of Nanomaterials - Composition Analysis of Nanopowders

    Characterization and testing technology is the fundamental way to scientifically identify nanomaterials, understand their diverse structures, and evaluate their special properties. The main purpose of characterization of nanomaterials is to determine some physical and chemical properties of nanomaterials, such as morphology, size, particle size, chemical composition, crystal structure, band gap an...
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  • 09

    Jun

    Characterization of Nanomaterials-Structural Analysis of Nanopowders

    Characterization and testing technology is the fundamental way to scientifically identify nanomaterials, understand their diverse structures, and evaluate their special properties. The main purpose of characterization of nanomaterials is to determine some physical and chemical properties of nanomaterials, such as morphology, size, particle size, chemical composition, crystal structure, band gap an...
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  • 08

    Aug

    A brief introduction to ICP-MS for chemical total elemental analysis

    ICP-MS Inductively Coupled Plasma Mass Spectrometer is an analytical instrument that combines ICP technology and mass spectrometry. It can simultaneously measure dozens of trace elements. The instrument covers a wide range of elements, including alkali metals, alkaline earth metals, transition Metals and other metalloids, rare earth elements, most halogens and some non-metallic elements. Principle...
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  • 09

    Apr

    What is the reason for the shift of XRD (X-ray diffraction) peaks?

    The reasons for peak shift in XRD (X-ray diffraction) usually involve changes in the properties of the sample itself or the influence of experimental conditions, which can be analyzed from the following aspects: 1. Sample factors 1.1 Residual stress or lattice strain Residual stress: Residual stress inside the material (such as compressive stress or tensile stress) can cause changes in the lattice...
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