Characterization and testing technology is the fundamental way to scientifically identify nanomaterials, understand their diverse structures, and evaluate their special properties. The main purpose of characterization of nanomaterials is to determine some physical and chemical properties of nanomaterials, such as morphology, size, particle size, chemical composition, crystal structure, band gap and light absorption properties.

The phase structure and crystal structure of nanomaterials play an important role in the performance of materials. At present, the structure analysis methods of nanopowders are commonly used as follows:
1. X-ray diffraction analysis
XRD is the abbreviation of X-ray diffraction, which is a research method of X-ray diffraction, which is a research method to obtain information such as the composition of the material, the structure or morphology of atoms or molecules inside the material by analyzing the diffraction pattern of the material by X-ray diffraction.
Determination of crystallization, crystal phase, lattice constant, crystal structure and bonding state.
Amorphous samples cannot be analyzed.
It is mainly suitable for inorganic substances, and the particle size of powder samples is usually required to be in the range of 0.1-10um.

2. Laser Raman Analysis
Raman spectroscopy of laser light sources. English Laser Raman Spectrometry.
The analysis is fast, simple, reproducible, and more importantly, non-destructive qualitative and quantitative analysis, which requires no sample preparation, and the sample can be measured directly through the fiber optic probe or through glass, silica, and fiber optic. Raman spectroscopy, like infrared spectroscopy, can perform qualitative and quantitative analysis of samples at the same time, and the two complement each other.
Mainly used for surface and thin film characterization
Applied to crystal phase structure, particle size, film thickness, microstructure analysis, etc.

3. Electron Diffraction Analysis
The angle of electron beam diffraction is small, the measurement accuracy is poor, and the measurement of crystal structure is not as good as XRD.
The electron beam is very thin, suitable for micro-analysis
It is mainly used to determine the phases and their orientation relationship with the matrix.
The electron diffraction intensity is large, and the required exposure time is short, and the diffraction pattern can be quickly captured.