Scanning electron microscope (SEM) is a key tool for modern scientific exploration of the microscopic world. It plays an irreplaceable role in scientific research and industrial applications by enabling us to gain insights into the microscopic structure of matter through high-resolution electronic imaging technology. SEM scans the surface of the sample with a high-energy electron beam to collect s...
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The major limitations on TEM performance are spherical aberration (also known as aberration), chromatic aberration, and astigmatism. The spherical aberration and chromatic aberration limit the resolution of traditional TEM. Both of these defects are inevitable when using static rotational symmetric electromagnetic fields. Ball aberration is the most important factor determining the performance of ...
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In transmission electron microscopy (TEM) analysis, the primary and crucial step in obtaining a high-quality image that can be interpreted reasonably is sample preparation. Inappropriate sample thickness, poor conductivity, or damage introduced during sample preparation can directly lead to abnormal electron beam penetration, image distortion, and even sample scrapping. TEM sample requirements ① T...
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Powder surface modification changes the surface state of particles through physical or chemical means, with the core being to break the agglomeration force between particles. When the particle size of the powder decreases to the micrometer or nanometer level, the surface energy sharply increases, and van der Waals forces, hydrogen bonds, and other gravitational forces cause the particles to sponta...
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