Scanning electron microscope (SEM) is a key tool for modern scientific exploration of the microscopic world. It plays an irreplaceable role in scientific research and industrial applications by enabling us to gain insights into the microscopic structure of matter through high-resolution electronic imaging technology. SEM scans the surface of the sample with a high-energy electron beam to collect s...
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The major limitations on TEM performance are spherical aberration (also known as aberration), chromatic aberration, and astigmatism. The spherical aberration and chromatic aberration limit the resolution of traditional TEM. Both of these defects are inevitable when using static rotational symmetric electromagnetic fields. Ball aberration is the most important factor determining the performance of ...
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