Scanning electron microscope (SEM) is a key tool for modern scientific exploration of the microscopic world. It plays an irreplaceable role in scientific research and industrial applications by enabling us to gain insights into the microscopic structure of matter through high-resolution electronic imaging technology. SEM scans the surface of the sample with a high-energy electron beam to collect s...
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The reasons for peak shift in XRD (X-ray diffraction) usually involve changes in the properties of the sample itself or the influence of experimental conditions, which can be analyzed from the following aspects: 1. Sample factors 1.1 Residual stress or lattice strain Residual stress: Residual stress inside the material (such as compressive stress or tensile stress) can cause changes in the lattice...
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The major limitations on TEM performance are spherical aberration (also known as aberration), chromatic aberration, and astigmatism. The spherical aberration and chromatic aberration limit the resolution of traditional TEM. Both of these defects are inevitable when using static rotational symmetric electromagnetic fields. Ball aberration is the most important factor determining the performance of ...
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High entropy alloys (HEAs) are a new type of structural material composed of five or more elements in nearly equal atomic ratios, exhibiting characteristics such as high entropy effect, lattice distortion effect, slow diffusion effect, and cocktail effect. Laser cladding technology can significantly improve the hardness, wear resistance, and corrosion resistance of HEAs cladding layers due to its ...
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