1. Classification of Scanning Electron Microscopes Scanning electron microscopy can be divided into thermal electron emission type and field emission type according to the different ways of electron generation. The filament used for thermal electron emission type is mainly tungsten filament electron microscopy. Field emission type The distinction between hot field emission and cold field emission....
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In copper-clad laminates, spherical silicon micro powders with excellent fluidity can achieve high filling in the resin matrix of copper-clad laminates, thereby further reducing production costs, basic thermal expansion coefficients, and dielectric constants. One of the most commonly used systems for high-frequency copper-clad laminates is PTFE resin, which requires a high filling amount of filler...
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The essence of sintering is that the powder block is heated in an appropriate environment or atmosphere, and through a series of physical and chemical changes, the bonding between powder particles undergoes a qualitative change. The strength and density of the block increase rapidly, and other physical and mechanical properties are also significantly improved. The performance of ceramic materials ...
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The properties of vanadium dioxide: The molecular formula of vanadium dioxide is VO2, with a molecular weight of 82.94. It is a dark blue crystal powder with a monoclinic crystal structure. Insoluble in water, easily soluble in acid and alkali. When dissolved in acid, it cannot generate tetravalent ions, but generates positive divalent vanadium oxide ions. When heated to red heat in a dry hydrogen...
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Scanning electron microscope (SEM) is a key tool for modern scientific exploration of the microscopic world. It plays an irreplaceable role in scientific research and industrial applications by enabling us to gain insights into the microscopic structure of matter through high-resolution electronic imaging technology. SEM scans the surface of the sample with a high-energy electron beam to collect s...
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The reasons for peak shift in XRD (X-ray diffraction) usually involve changes in the properties of the sample itself or the influence of experimental conditions, which can be analyzed from the following aspects: 1. Sample factors 1.1 Residual stress or lattice strain Residual stress: Residual stress inside the material (such as compressive stress or tensile stress) can cause changes in the lattice...
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